Ishida IX-GA-4075-D Sistem inspektimi me rreze X (2008)Ishida
Röntgeninspektionssystem
Ishida IX-GA-4075-D Sistem inspektimi me rreze X (2008)
Ishida
Röntgeninspektionssystem
Viti i prodhimit
2008
Gjendje
I përdorur
Vendndodhje
Menslage 

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Të dhëna për makinën
- Përshkrimi i makinës:
- Ishida IX-GA-4075-D Sistem inspektimi me rreze X (2008)
- Prodhues:
- Ishida
- Model:
- Röntgeninspektionssystem
- Viti i prodhimit:
- 2008
- Gjendje:
- i përdorur
Çmimi & Vendndodhja
- Vendndodhja e shitësit:
- Mühlenhorst 8, 49637 Menslage, Gjermania

Telefononi
Detajet e ofertës
- ID e shpalljes:
- A21662463
- Numri i referencës:
- DE-INS-ISH-2008-00001
- Përditësim:
- së fundmi më 06.04.2026
Përshkrim
Overview This Ishida IX-GA-4075-D X-ray inspection system was manufactured in 2008 and is designed for high-performance product inspection in food, beverage, and pharmaceutical production environments. The system is primarily used for foreign body detection, identifying contaminants such as metal, glass, stones, and high-density plastics that may not be detected by conventional metal detectors. In addition to contamination detection, the machine can also support product integrity checks, such as identifying missing components or estimating product consistency. The system is built with a robust stainless steel construction, making it suitable for industrial environments with high hygiene requirements. The inspection process is based on X-ray imaging, where products pass through the inspection chamber via conveyor. The system analyzes density differences in real time and automatically triggers a reject mechanism if contamination is detected. Technical Data Construction: Stainless steel frame for hygienic industrial use HMI: Integrated touchscreen for operation, calibration, and product changeover Electrical Data Power supply: AC 230 V, single phase Current: 11.0 A Frequency: 50 / 60 Hz Inspection Function Detection of foreign bodies: Metal Glass Stones High-density plastics Additional capabilities: Product integrity verification Detection of missing components Density-based inspection
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